Open AccessReliability of the BTS-BSC System with Different Types of Communication Lines Between Them
Author(s) -
D.A. Davronbekov,
Utkir Karimovich Matyokubov
Publication year - 2020
Publication title -
international journal of advanced trends in computer science and engineering
Language(s) - English
Resource type - Journals
ISSN - 2278-3091
DOI - 10.30534/ijatcse/2020/362942020
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , engineering , physics , power (physics) , quantum mechanics