Open Access
Measurement of Different Illumination and Image Target on Complementary Metal Oxide Semiconductor (CMOS)
Author(s) -
Norsuzila Ya’acob,
Teknologi Mara Malaysia
Publication year - 2019
Publication title -
international journal of advanced trends in computer science and engineering
Language(s) - English
Resource type - Journals
ISSN - 2278-3091
DOI - 10.30534/ijatcse/2019/0181.62019
Subject(s) - cmos , semiconductor , materials science , optoelectronics , metal , oxide , image sensor , image (mathematics) , nanotechnology , optics , computer science , computer vision , physics , metallurgy