Open AccessThickness Effect of CuAlTe2 Thin Films on Morphological, Structural and Visual Properties
Author(s) -
Noor Azlina Hassan,
Iman Hameed Khudayer
Publication year - 2020
Publication title -
mağallaẗ ibn al-haytam li-l-ʻulūm al-ṣirfaẗ wa-al-taṭbīqiyyaẗ/ibn al-haitham journal for pure and applied sciences
Language(s) - English
Resource type - Journals
eISSN - 2521-3407
pISSN - 1609-4042
DOI - 10.30526/33.3.2471
Subject(s) - materials science , absorbance , tetragonal crystal system , thin film , optics , evaporation , band gap , wavelength , diffraction , grain size , surface finish , analytical chemistry (journal) , optoelectronics , crystallography , composite material , crystal structure , nanotechnology , chemistry , physics , chromatography , thermodynamics
CuAlTe2 thin films were evaporation on glass substrates using the technique of thermal evaporation at different range of thickness (200,300,400and500) ±2nm. The structures of these films were investigated by X-ray diffraction method; showing that films possess a good crystalline in tetragonal structure. AFM showed that the grain size increased from (70.55-99.40) nm and the roughness increased from (2.08-3.65) nm by increasing the thickness from (200-500) nm. The optical properties measurements, such as absorbance, transmtance, reflectance, and optical constant as a function of wavelength showed that the direct energy gap decreased from (2.4-2.34) eV by the gain of the thickness.