
Classification Method of Image Feature Matching Using Naive Bayes Classifier
Author(s) -
Jin Yong Kim,
Eun Kyeong Kim,
Baekcheon Kim,
Daekeon Ha,
Sungshin Kim
Publication year - 2021
Publication title -
atlantis studies in uncertainty modelling/atlantis studies in uncertainty modelling
Language(s) - English
Resource type - Conference proceedings
ISSN - 2589-6644
DOI - 10.2991/asum.k.210827.058
Subject(s) - naive bayes classifier , artificial intelligence , pattern recognition (psychology) , computer science , bayes classifier , classifier (uml) , feature extraction , contextual image classification , bayes error rate , image matching , feature (linguistics) , feature matching , matching (statistics) , image (mathematics) , support vector machine , mathematics , statistics , linguistics , philosophy