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Polarimetric approach for well-defined impurities detection in isotropic materials
Author(s) -
Andrea Buono,
Mario Iodice,
Ivo Rendina,
Ferdinando Nunziata,
M. Migliaccio
Publication year - 2014
Publication title -
journal of the european optical society. rapid publications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.357
H-Index - 33
ISSN - 1990-2573
DOI - 10.2971/jeos.2014.14010
Subject(s) - isotropy , impurity , symmetry (geometry) , sample (material) , measure (data warehouse) , homogeneous , polarimetry , matrix (chemical analysis) , mueller calculus , materials science , condensed matter physics , physics , statistical physics , optics , mathematics , thermodynamics , geometry , computer science , quantum mechanics , composite material , scattering , database
In this paper, a new kind of approach to reveal the presence of well-defined impurities in isotropic materials is proposed and verified against actual measurements over real samples. The rationale lies in the different polarimetric symmetry properties of inhomogeneous and isotropic materials within well-defined impurities from homogeneous ones. The underpinning physical idea is to inspect the Mueller matrix of the material sample, obtained from an ellipsometric measure: its form, in terms of symmetry, can reveal whether or not if in there are well-defined impurities in the sample

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