Open AccessApplication of the method of auxiliary sources to a defect-detection inverse problem of optical diffraction microscopy
Author(s) -
Mirza Karamehmedović,
Mads Hoy Sørensen,
PoulErik Hansen,
Andrei V. Lavrinenko
Publication year - 2010
Publication title -
journal of the european optical society rapid publications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.357
H-Index - 33
ISSN - 1990-2573
DOI - 10.2971/jeos.2010.10021
Subject(s) - diffraction , microscopy , optics , inverse , inverse problem , optical microscope , physics , computer science , materials science , mathematics , mathematical analysis , geometry , scanning electron microscope
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