z-logo
open-access-imgOpen Access
New Approach for Monitoring a Direct Laser Interference Patterning Process Using a Combination of an Infrared Camera and a Diffraction Measurement System
Author(s) -
Nikolai Schröder,
Sascha Teutoburg-Weiss,
G. Vergara,
Andrés Fabián Lasagni
Publication year - 2021
Publication title -
journal of laser micro/nanoengineering
Language(s) - English
Resource type - Journals
ISSN - 1880-0688
DOI - 10.2961/jlmn.2021.02.2009
Subject(s) - materials science , interference (communication) , diffraction , infrared , optics , laser , process (computing) , optoelectronics , computer science , physics , telecommunications , operating system , channel (broadcasting)

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom