Open AccessStructural and Electronic Characterization of CuxBi2Se3
Author(s) -
Paola Arévalo López,
Francisco Morales Leal,
Roberto Escudero Derat
Publication year - 2017
Publication title -
journal of the mexican chemical society
Language(s) - English
Resource type - Journals
ISSN - 2594-0317
DOI - 10.29356/jmcs.v60i3.91
Subject(s) - x ray photoelectron spectroscopy , superconductivity , characterization (materials science) , copper , diffraction , materials science , topological insulator , electronic structure , crystallography , chemistry , condensed matter physics , nanotechnology , nuclear magnetic resonance , computational chemistry , physics , optics , metallurgy
Topological insulator Bi2Se3 becomes superconductor when it is intercalated with copper. In this work, we present our studies related to the electronic and structural characterization of CuxBi2Se3 with Cu variation from x = 0.11 to 0.20. We show structural and chemical studies performed via X-ray diffraction and photoelectron spectroscopy. Cu insertion modifies the Bi and Se binding energies and induces superconductivity in the compound.