MD and TEM evaluation of swift Xe ion induced latent tracks in Si3N4
Author(s) -
R.A. Rymzhanov,
A. Zhalmagambetova,
Anel Ibrayeva,
A. Janse van Vuuren,
J.H. O’Connell,
В.А. Скуратов
Publication year - 2019
Publication title -
eurasian journal of physics and functional materials
Language(s) - English
Resource type - Journals
eISSN - 2616-8537
pISSN - 2522-9869
DOI - 10.29317/2019030409
Subject(s) - swift , ion , materials science , swift heavy ion , physics , astrophysics , fluence , quantum mechanics
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