Open AccessGrowth, High Resolution X-Ray Diffraction, Z-Scan, Laser Damage Threshold, Etching of Maleic Acid Single Crystals by Slow Evaporation Method
Author(s) -
S. Ramamoorthy,
S. Sundaravadivel .,
. E.Tamilselvi,
C. S. Chidan Kumar,
K. Sureshkumar,
. A.Thangavel,
Matthew Angel
Publication year - 2019
Publication title -
international journal of advanced science and engineering
Language(s) - English
Resource type - Journals
eISSN - 2454-9967
pISSN - 2349-5359
DOI - 10.29294/ijase.5.3.2019.998-1002
Subject(s) - etching (microfabrication) , resolution (logic) , evaporation , materials science , maleic acid , x ray , diffraction , optics , laser , analytical chemistry (journal) , crystallography , chemistry , nanotechnology , composite material , physics , layer (electronics) , chromatography , artificial intelligence , computer science , copolymer , thermodynamics , polymer