Open AccessMEASURING AND MODELING THE EFFECT OF LOW INTENSITY RADIATION ON DIGITAL CMOS ICS
Author(s) -
Звягинцев Дмитрий Евгеньевич,
Елисеева Алена Валерьевна,
Куликов Никита Андреевич,
Харитонов Игорь Анатольевич,
Самбурский Лев Михайлович
Publication year - 2020
Publication title -
international forum “microelectronics – 2020”. joung scientists scholarship “microelectronics – 2020”. xiii international conference «silicon – 2020». xii young scientists scholarship for silicon nanostructures and devices physics, material science, process and analysis
Language(s) - English
Resource type - Conference proceedings
DOI - 10.29003/m1610.silicon-2020/232-235
Subject(s) - spice , cmos , electronic engineering , transistor , materials science , radiation , absorbed dose , semiconductor device modeling , optoelectronics , electrical engineering , engineering , physics , optics , voltage