Open AccessTCAD SIMULATION OF SELBOX AND DSOI CMOS SRAM FAILURE
Author(s) -
D. Popov,
Moscow Miem Nru Hse
Publication year - 2020
Publication title -
international forum “microelectronics – 2020”. joung scientists scholarship “microelectronics – 2020”. xiii international conference «silicon – 2020». xii young scientists scholarship for silicon nanostructures and devices physics, material science, process and analysis
Language(s) - English
Resource type - Conference proceedings
DOI - 10.29003/m1608.silicon-2020/227-229
Subject(s) - silicon on insulator , static random access memory , spice , mosfet , cmos , materials science , transistor , optoelectronics , electronic engineering , electrical engineering , silicon , engineering , voltage