Open AccessINVESTIGATION OF LOSSES IN SILICON AT MICROWAVE FREQUENCIES
Author(s) -
М.С. Ромодин,
Aleksei Dorofeev,
П.В. Панасенко,
Sergei Fedotov,
Aleksandr Tsarev
Publication year - 2019
Publication title -
international forum “microelectronics – 2020”. joung scientists scholarship “microelectronics – 2020”. xiii international conference «silicon – 2020». xii young scientists scholarship for silicon nanostructures and devices physics, material science, process and analysis
Language(s) - English
Resource type - Conference proceedings
DOI - 10.29003/m1581.silicon-2020/139-142
Subject(s) - monolithic microwave integrated circuit , silicon , materials science , heterojunction , optoelectronics , substrate (aquarium) , microwave , wide bandgap semiconductor , electronic engineering , computer science , telecommunications , engineering , cmos , amplifier , oceanography , geology