Open AccessCONSIDERATION OF SURFACE RECOMBINATION WHEN MEASURING THE RECOMBINATION LIFETIME FROM THE PHOTOCONDUCTIVITY DECAY IN LARGE-THICKNESS SAMPLES
Author(s) -
С. П. Кобелева,
Ivan Schemerov,
Artem Sharapov,
S. V. Yurchuk
Publication year - 2020
Publication title -
international forum “microelectronics – 2020”. joung scientists scholarship “microelectronics – 2020”. xiii international conference «silicon – 2020». xii young scientists scholarship for silicon nanostructures and devices physics, material science, process and analysis
Language(s) - English
Resource type - Conference proceedings
DOI - 10.29003/m1555.silicon-2020/55-58
Subject(s) - photoconductivity , recombination , materials science , diffusion , carrier lifetime , silicon , maxima , work (physics) , surface (topology) , atomic physics , molecular physics , optoelectronics , physics , chemistry , thermodynamics , mathematics , geometry , art , biochemistry , performance art , gene , art history