
APPLICATION OF MACHINE LEARNING METHODS TO APPROXIMATE THE EXPERIMENTAL CHARACTERISTICS OF A MEMRISTOR
Author(s) -
V. Lopatenko
Publication year - 2020
Language(s) - English
Resource type - Conference proceedings
DOI - 10.29003/m1536.mmmsec-2020/116-119
Subject(s) - memristor , microelectronics , computer science , artificial neural network , boosting (machine learning) , artificial intelligence , memistor , electronic engineering , machine learning , resistive random access memory , engineering , electrical engineering , voltage