Open AccessPhotographic guide of selected external defect indicators and associated internal defects in yellow birch
Author(s) -
Everette D. Rast,
John A. Beaton,
David L. Sonderman
Publication year - 1991
Publication title -
hathi trust digital library (the hathitrust research center)
Language(s) - English
Resource type - Reports
DOI - 10.2737/ne-rp-648
Subject(s) - computer science , forensic engineering , engineering
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