Open AccessAbout the reliability of circuits with faults of type 0 at the outputs of elements in the complete finite basis containing a special function
Author(s) -
Марина Анатольевна Алехина,
Yulia Sergeevna Gusynina,
Tat'ana Aleksandrovna Shornikova
Publication year - 2019
Publication title -
izvestiâ vysših učebnyh zavedenij. matematika
Language(s) - English
Resource type - Journals
eISSN - 2076-4626
pISSN - 0021-3446
DOI - 10.26907/0021-3446-2019-6-85-88
Subject(s) - basis (linear algebra) , type (biology) , reliability (semiconductor) , function (biology) , electronic circuit , reliability engineering , computer science , mathematics , engineering , electrical engineering , geology , geometry , physics , biology , paleontology , power (physics) , quantum mechanics , evolutionary biology