
Study of the optical phenomena in zircon with a Scanning Electron Microscope (SEM), using cathodoluminescence method and secondary electrons.
Author(s) -
Alan Freitas Machado,
Luís Sérgio Brasiliense Cairo,
Armando Dias Tavares,
Luiz Pinheiro Cordovil da Silva,
Vinicius Vianna Riguête,
Claudio Elias da Silva
Publication year - 2016
Publication title -
revista brasileira de geografia física
Language(s) - English
Resource type - Journals
ISSN - 1984-2295
DOI - 10.26848/rbgf.v9.6.p2082-2088
Subject(s) - cathodoluminescence , zircon , scanning electron microscope , electron , secondary electrons , environmental scanning electron microscope , materials science , laser ablation , electron microscope , sample (material) , analytical chemistry (journal) , optics , mineralogy , laser , geology , chemistry , optoelectronics , luminescence , physics , composite material , geochemistry , chromatography , quantum mechanics
The objective of this study is to analyze, describe and characterize, images in SEM (Scanning Electron Microscopy) and how a zircon sample ZR 008 (CRL05) behaves, in order to determine the possible locations where the laser ablation will be made (Ar/F). This procedure will be done to assist in the geological dating process, using the method by ICP / MS. Cathodluminescence and secondary electrons method were used in the process.