Open AccessA linear approach for wheat yield prediction by using different spectral vegetation indices
Author(s) -
Yunus Kaya,
Nizar Polat
Publication year - 2023
Publication title -
international journal of engineering and geosciences
Language(s) - English
Resource type - Journals
ISSN - 2548-0960
DOI - 10.26833/ijeg.1035037
Subject(s) - normalized difference vegetation index , vegetation index , yield (engineering) , vegetation (pathology) , satellite , correlation coefficient , enhanced vegetation index , stage (stratigraphy) , index (typography) , mathematics , agriculture , linear regression , coefficient of determination , environmental science , estimation , regression analysis , remote sensing , statistics , leaf area index , geography , agronomy , computer science , geology , engineering , materials science , systems engineering , aerospace engineering , archaeology , pathology , world wide web , biology , paleontology , metallurgy , medicine