Open AccessScalar Dielectric Constant Extraction of Planar Materials from Reflection Measurements
Author(s) -
Bektaş Çolak
Publication year - 2020
Publication title -
european mechanical science
Language(s) - English
Resource type - Journals
ISSN - 2587-1110
DOI - 10.26701/ems.623406
Subject(s) - dielectric , electromagnetic shielding , reflection coefficient , reflection (computer programming) , planar , scalar (mathematics) , calibration , materials science , optics , acoustics , computational physics , optoelectronics , physics , computer science , composite material , mathematics , geometry , quantum mechanics , computer graphics (images) , programming language
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