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The Influence of Different Thickness on The Physical Properties of Tio2 Thin Films Prepared by Chemical Thermal Evaporation
Author(s) -
Muhaj T. Abdullah
Publication year - 2021
Publication title -
maǧallaẗ ǧāmi'aẗ duhūk
Language(s) - English
Resource type - Journals
eISSN - 2521-4861
pISSN - 1812-7568
DOI - 10.26682/sjuod.2021.24.1.12
Subject(s) - evaporation , thin film , materials science , thermal , wavelength , band gap , optics , optoelectronics , analytical chemistry (journal) , nanotechnology , chemistry , physics , chromatography , meteorology , thermodynamics

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