Open AccessAdapted method for monitoring functional failures in NOR FLASH-memory during tests for resistance to heavy charged particles
Author(s) -
Roman I. Gvozdev,
Ivan I. Shvetsov-Shilovskiy,
Sergey B. Shmakov
Publication year - 2020
Publication title -
bezopasnostʹ informacionnyh tehnologij
Language(s) - English
Resource type - Journals
eISSN - 2074-7136
pISSN - 2074-7128
DOI - 10.26583/bit.2020.3.06
Subject(s) - flash (photography) , flash memory , resistance (ecology) , computer science , reliability engineering , nuclear engineering , embedded system , engineering , physics , biology , optics , ecology