Open AccessSingle Event Effects Rate Calculation with Different Models
Author(s) -
A. I. Chumakov,
V. M. Uzhegov,
Alexey O. Akhmetov,
D. V. Boychenko,
Andrey V. Yanenko,
N.V. Ryasnoy
Publication year - 2017
Publication title -
bezopasnost informacionnyh tehnology
Language(s) - English
Resource type - Journals
eISSN - 2074-7136
pISSN - 2074-7128
DOI - 10.26583/bit.2017.1.09
Subject(s) - failure rate , reliability (semiconductor) , event (particle physics) , reliability engineering , set (abstract data type) , computer science , probability distribution , statistics , mathematics , engineering , physics , power (physics) , quantum mechanics , programming language
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