Open AccessDetermination of the resistance of external parameters to the degradation of the parameters of silicon photocells with input nickel atoms
Author(s) -
Elyor Bakhriddinovich Saitov
Publication year - 2022
Publication title -
physical sciences and technology
Language(s) - English
Resource type - Journals
eISSN - 2522-1361
pISSN - 2409-6121
DOI - 10.26577/phst.2022.v9.i1.04
Subject(s) - photoresistor , impurity , silicon , nickel , chemistry , thermal stability , radiation resistance , nanoclusters , degradation (telecommunications) , materials science , radiation , analytical chemistry (journal) , optoelectronics , nanotechnology , metallurgy , optics , electronic engineering , physics , organic chemistry , engineering