Open AccessNonlinear electrical properties of nanostructured porous silicon films
Author(s) -
Zeinulla Zh. Zhanabaev,
M.K. Ibraimov,
Yerulan Sagidolda
Publication year - 2014
Publication title -
physical sciences and technology
Language(s) - English
Resource type - Journals
eISSN - 2522-1361
pISSN - 2409-6121
DOI - 10.26577/phst-2014-1-17
Subject(s) - porous silicon , materials science , nanometre , porosity , fractal , silicon , diode , etching (microfabrication) , optoelectronics , nanotechnology , morphology (biology) , spreading resistance profiling , scanning electron microscope , composite material , layer (electronics) , mathematical analysis , mathematics , biology , genetics