Open AccessNonlinear electrical properties of nanostructured porous silicon films
Author(s) -
Z. Zh. Zhanabaev,
Margulan Ibraimov,
Yerulan Sagidolda
Publication year - 2014
Publication title -
physical sciences and technology
Language(s) - English
Resource type - Journals
eISSN - 2522-1361
pISSN - 2409-6121
DOI - 10.26577/phst-2014-1-17
Subject(s) - porous silicon , materials science , nanometre , fractal , porosity , silicon , etching (microfabrication) , diode , optoelectronics , morphology (biology) , nonlinear system , nanotechnology , spreading resistance profiling , composite material , layer (electronics) , mathematical analysis , mathematics , biology , genetics , physics , quantum mechanics
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