Open AccessElectron backscatter diffraction in the silicon nanowires
Author(s) -
К.К. Dikhanbayev,
В. Сиваков,
Florian Talkenberg,
Gauhar Mussabek,
Ye. T. Taurbayev,
N.N. Tanatov,
E. Shabdan
Publication year - 2015
Publication title -
physical sciences and technology
Language(s) - English
Resource type - Journals
eISSN - 2522-1361
pISSN - 2409-6121
DOI - 10.26577/2409-6121-2015-2-2-4-11
Subject(s) - electron backscatter diffraction , materials science , silicon , nanowire , etching (microfabrication) , photoluminescence , isotropic etching , scanning electron microscope , crystallite , diffraction , electron diffraction , texture (cosmology) , field electron emission , optics , optoelectronics , electron , nanotechnology , microstructure , composite material , metallurgy , physics , computer science , image (mathematics) , layer (electronics) , quantum mechanics , artificial intelligence