Open AccessQUALITY CONTROL OF SAN’AO TABLETS VIA X-RAY DIFFRACTION AND ELEC TRON SPIN RESONANCE TECHNIQUES
Publication year - 2018
Publication title -
topics in chemical & material engineering
Language(s) - English
Resource type - Conference proceedings
DOI - 10.26480/icnmim.01.2018.121.123
Subject(s) - diffraction , quality (philosophy) , resonance (particle physics) , materials science , physics , x ray crystallography , spin (aerodynamics) , optics , atomic physics , nuclear magnetic resonance , quantum mechanics , thermodynamics