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Fabrication of optical fiber probes for scanning near-field optical microscopy
Author(s) -
Guo Si,
Jeffrey LeDue,
Peter Grütter
Publication year - 2008
Publication title -
mcgill science undergraduate research journal
Language(s) - English
Resource type - Journals
eISSN - 1718-0783
pISSN - 1718-0775
DOI - 10.26443/msurj.v3i1.129
Subject(s) - near field scanning optical microscope , materials science , optical microscope , optics , microscopy , focused ion beam , diffraction , optical fiber , tapering , resolution (logic) , scanning ion conductance microscopy , scanning probe microscopy , fabrication , aperture (computer memory) , optoelectronics , scanning electron microscope , scanning confocal electron microscopy , chemistry , physics , ion , medicine , computer graphics (images) , organic chemistry , alternative medicine , pathology , artificial intelligence , computer science , acoustics

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