
Contribution of Atomic force Microscopy to particle resuspension studies
Author(s) -
S. Peillon,
Jesica Gisele Benito,
Thomas Gélain,
F. Gensdarmes,
Olivier Pluchery,
Christian Grisolia
Publication year - 2020
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.25576/asfera-cfa2020-19716
Subject(s) - atomic force microscopy , physics , van der waals force , materials science , nanotechnology , molecule , quantum mechanics