Open AccessFT-NIR: A Tool for Process Monitoring and More
Author(s) -
D. Martoccia,
Holger Lutz,
Yvan Cohen,
Thomas Jerphag,
Urban Jenelten
Publication year - 2018
Publication title -
chimia
Language(s) - English
Resource type - Journals
eISSN - 2673-2424
pISSN - 0009-4293
DOI - 10.2533/chimia.2018.139
Subject(s) - rework , process engineering , process (computing) , process analytical technology , computer science , raw material , near infrared spectroscopy , work in process , process control , production (economics) , environmental science , engineering , chemistry , operations management , embedded system , operating system , physics , organic chemistry , quantum mechanics , economics , macroeconomics
With ever-increasing pressure to optimize product quality, to reduce cost and to safely increase production output from existing assets, all combined with regular changes in terms of feedstock and operational targets, process monitoring with traditional instruments reaches its limits. One promising answer to these challenges is in-line, real time process analysis with spectroscopic instruments, and above all Fourier-Transform Near Infrared spectroscopy (FT-NIR). Its potential to afford decreased batch cycle times, higher yields, reduced rework and minimized batch variance is presented and application examples in the field of fine chemicals are given. We demonstrate that FT-NIR can be an efficient tool for improved process monitoring and optimization, effective process design and advanced process control.