Crystallographic Services and Technology Support for Industry
Author(s) -
A. Neels,
O. Sereda,
Tobias Bandi,
Xavier Maeder
Publication year - 2014
Publication title -
chimia international journal for chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.387
H-Index - 55
eISSN - 2673-2424
pISSN - 0009-4293
DOI - 10.2533/chimia.2014.14
Subject(s) - microtechnology , nanotechnology , materials science , engineering physics , diffraction , engineering , physics , optics
The activities of CSEM's XRD Application Lab are oriented towards the analytical support of technology and product development in the fields of materials sciences, microtechnology, physics, chemistry, nanotechnology and life sciences. Non-destructive X-ray diffraction methods are used for the structural investigation of materials, components and systems. New developments are made with a focus on in situ techniques to 'watch the action' – structural transformations in dependence of applied external fields such as temperature, humidity, magnetic fields or mechanical stresses.
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