Open AccessTXRF Spektrometer zum Nachweis von Spurenelementen
Author(s) -
F. Hegedüs
Publication year - 1992
Publication title -
chimia
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.387
H-Index - 55
eISSN - 2673-2424
pISSN - 0009-4293
DOI - 10.2533/chimia.1992.477
Subject(s) - x ray fluorescence , analytical chemistry (journal) , materials science , chemistry , fluorescence , environmental chemistry , physics , optics
The TXRF (total reflection X-ray fluorescence) spectrometer is a very useful instrument for measuring ultratrace elements in aqueous solutions, in metals, in minerals, in biological and environmental samples etc. Elements with atomic number >13 are detected simultaneously with a minimum detection limit of pg. The sample preparation is very simple and only few ?g or ?l sample material is required.