Open AccessProbe device for electrical measurements of parameters thin doped films ZnO
Author(s) -
А. И. Блесман,
Р. Б. Бурлаков
Publication year - 2020
Publication title -
omskij naučnyj vestnik
Language(s) - English
Resource type - Journals
eISSN - 2541-7541
pISSN - 1813-8225
DOI - 10.25206/1813-8225-2020-169-67-72
Subject(s) - doping , materials science , optoelectronics , thin film , engineering physics , nanotechnology , engineering