
Metrological reliability of automated control systems and diagnostics of electronic equipment products of UHF band
Author(s) -
Galiikonova
Publication year - 2018
Publication title -
omskij naučnyj vestnik
Language(s) - English
Resource type - Journals
eISSN - 2541-7541
pISSN - 1813-8225
DOI - 10.25206/1813-8225-2018-162-196-201
Subject(s) - ultra high frequency , reliability (semiconductor) , metrology , reliability engineering , electronic equipment , computer science , engineering , electrical engineering , physics , optics , power (physics) , quantum mechanics