Open AccessDetermination of contact resistivity of ohmic contacts to semiconductor plates by the method Cox-Strack
Author(s) -
Р. Б. Бурлаков
Publication year - 2018
Publication title -
omskij naučnyj vestnik
Language(s) - English
Resource type - Journals
eISSN - 2541-7541
pISSN - 1813-8225
DOI - 10.25206/1813-8225-2018-160-119-123
Subject(s) - ohmic contact , electrical resistivity and conductivity , semiconductor , materials science , electrical contacts , optoelectronics , composite material , electrical engineering , engineering , layer (electronics)