Open AccessFast Precision Margin with the First-Order Reliability Method
Author(s) -
Zachary del Rosario,
Gianluca Iaccarino,
Richard W. Fenrich
Publication year - 2019
Publication title -
aiaa journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.828
H-Index - 158
eISSN - 1081-0102
pISSN - 0001-1452
DOI - 10.2514/1.j058345
Subject(s) - reliability (semiconductor) , margin (machine learning) , reliability engineering , computer science , mathematics , engineering , physics , power (physics) , quantum mechanics , machine learning
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