Open AccessA study on memory data retention in high-temperature environments for automotive
Author(s) -
Toan Dao Thanh
Publication year - 2020
Publication title -
tạp chí khoa học giao thông vận tải/transport and communications science journal
Language(s) - English
Resource type - Journals
eISSN - 2615-9554
pISSN - 1859-2724
DOI - 10.25073/tcsj.71.1.4
Subject(s) - data retention , acceleration , work (physics) , automotive industry , exponential function , non volatile memory , computer science , materials science , state (computer science) , optoelectronics , mechanical engineering , physics , engineering , thermodynamics , algorithm , mathematics , mathematical analysis , classical mechanics
The automotive memory devices especially work in high-temperature because they are located close to engine, exhaust units; those require high reliable operation and long-life data retention in high-temperature environments. This paper reports on the investigation of memory data retention of a nano-organic material-based nonvolatile memory in high-temperature environments. The decay of memory state current was theoretically presented as a stretched-exponential law. By fitting the measured currents to the stretched-exponential equation at different temperatures, the activation energy of decay and acceleration factor was deduced, which allows to predict the device performance at high-temperature environment like in a car. The method presented in study can be applied to estimate the memory data retention at high-temperature for other car memories