Open AccessImpact of Line Resistance Combined with Device Variability on Resistive RAM Memories
Author(s) -
Hassen Aziza,
P. Canet,
J. Postel-Pellerin
Publication year - 2018
Publication title -
advances in science, technology and engineering systems journal
Language(s) - English
Resource type - Journals
ISSN - 2415-6698
DOI - 10.25046/aj030102
Subject(s) - resistive touchscreen , line (geometry) , materials science , resistive random access memory , resistance (ecology) , optoelectronics , electrical engineering , engineering , voltage , biology , ecology , geometry , mathematics