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Structural and Morphological Properties of As-Deposited and Heat Treated Blended Graphene Oxide / Poly(3,4-Ethylenedioxythiophene)-Poly(Styrenesulfonate) Thin Films
Author(s) -
Saja Qasim,
Ameer F. Abdulameer,
Ali H. A. Jalaukhan
Publication year - 2021
Publication title -
iraqi journal of science
Language(s) - English
Resource type - Journals
eISSN - 2312-1637
pISSN - 0067-2904
DOI - 10.24996/ijs.2021.62.11(si).22
Subject(s) - pedot:pss , poly(3,4 ethylenedioxythiophene) , materials science , graphene , annealing (glass) , oxide , thin film , scanning electron microscope , chemical engineering , substrate (aquarium) , conductive polymer , spin coating , nanotechnology , layer (electronics) , composite material , polymer , metallurgy , oceanography , geology , engineering
    In this study the as-deposited and heat treated at 423K of conductive blend graphene oxide (GO)/ poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT:PSS) thin films was prepared with different PEDOT:PSS concentration (0, 0.25, 0.5, 0.75 and 1)w/w on pre-cleaned glass substrate by spin coater. The XRD analysis indicate the existence of the preffered peak (001) of GO around 2θ=8.24° which is domain in all GO/ PEDOT:PSS films characterized for GO, this result approve the good quality of the PEDOT:PSS dispersion in GO, this peak shifted to the lower 2θ with increasing PEDOT:PSS concentration and after annealing process. The scanning electron microscopy (SEM) images and atomic force microscopy (AFM) clearly show the GO flakes and go to disappear with increasing the PEDOT:PSS concentration. 

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