The Reliability and Validity of Various Lateral Side-Step Tests
Author(s) -
Brian T. McCormick
Publication year - 2014
Publication title -
ijass(international journal of applied sports sciences)
Language(s) - English
Resource type - Journals
eISSN - 2233-7946
pISSN - 1598-2939
DOI - 10.24985/ijass.2014.26.2.67
Subject(s) - reliability (semiconductor) , psychology , reliability engineering , validity , engineering , physics , developmental psychology , psychometrics , power (physics) , quantum mechanics
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