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Experimental identification of essential features of micro strip drawing with double deflection
Author(s) -
Lewin Rathmann,
Frank Vollertsen
Publication year - 2018
Publication title -
advanced technologies and materials
Language(s) - English
Resource type - Journals
eISSN - 2620-147X
pISSN - 2620-0325
DOI - 10.24867/atm-2018-2-001
Subject(s) - blank , deflection (physics) , materials science , enhanced data rates for gsm evolution , sheet metal , optics , die (integrated circuit) , radius , structural engineering , geometry , composite material , engineering , mathematics , physics , computer science , nanotechnology , telecommunications , computer security

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