Open AccessTarget Reliability Levels in Present Standards
Author(s) -
Milan Holický,
Jana Marková,
Milan Sýkora
Publication year - 2014
Publication title -
transactions of the všb technical university of ostrava. civil engineering series/sborník vědeckých prací vysoké školy báňské-technické univerzity ostrava. řada stavební
Language(s) - English
Resource type - Journals
eISSN - 1804-4824
pISSN - 1213-1962
DOI - 10.2478/tvsb-2014-0018
Subject(s) - reliability (semiconductor) , reliability engineering , index (typography) , computer science , engineering , world wide web , power (physics) , physics , quantum mechanics
The target reliability levels recommended in national and international documents vary within a broad range, while the reference to relevant costs and failure consequences is mentioned only very vaguely. In some documents the target reliability index is indicated for one or two reference periods (1 year, 50 years or life-time) without providing appropriate links to the design working life. This contribution attempts to clarify the relationship between the target reliability levels, costs of safety measures, failure consequences, reference periods and the design working lif