Open AccessHigh-Temperature X-Ray Diffraction and Fluorescence Spectra of SnSe Single Crystal
Author(s) -
J. I. Huseynov,
R. S. Mamedova,
I. I. Abbasov,
D. D. Askerov,
Khaver Sadig
Publication year - 2019
Publication title -
proceedings of the latvian academy of sciences. section b, natural sciences/latvijas zinātņu akadēmijas vēstis. a daļa, humanitārās un sociālās zinātnes
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.168
H-Index - 9
eISSN - 2255-890X
pISSN - 1407-009X
DOI - 10.2478/prolas-2019-0079
Subject(s) - fluorescence , materials science , analytical chemistry (journal) , diffraction , single crystal , wavelength , crystal (programming language) , spectral line , thermal expansion , atmospheric temperature range , temperature coefficient , optics , crystallography , chemistry , optoelectronics , physics , programming language , chromatography , astronomy , meteorology , computer science , metallurgy , composite material
The temperature dependence of unit cell parameters was studied using high-temperature X-ray diffraction and the coefficient of thermal expansion of SnSe single crystal was determined. Fluorescence spectra of SnSe single crystal grown by the Bridgman-Stockbarger method were examined using a Cary Eclipse spectrophotometer at room temperature in the wavelength range 200–900 nm. When the samples were irradiated by a pulse at a wavelength of 230 nm, the fluorescence spectra exhibited maxima at wavelengths 313.07, 423.03, 458.93, 495.07, and 530.00 nm.