Open AccessA New Press Pack IGBT for High Reliable Applications With Short Circuit Failure Mode
Author(s) -
Heng Wang,
Jens Przybilla,
Hao Zhang,
Juergen Schiele
Publication year - 2021
Publication title -
cpss transactions on power electronics and applications
Language(s) - English
Resource type - Journals
ISSN - 2475-742X
DOI - 10.24295/cpsstpea.2021.00009
Subject(s) - insulated gate bipolar transistor , failure mode and effects analysis , short circuit , electrical engineering , mode (computer interface) , reliability engineering , computer science , engineering , materials science , voltage , operating system