Real-Time Diagnosis of Multiple Transistor Open-Circuit Faults in a T-Type Inverter Based on Finite-State Machine Model | Zendy

Borong Wang | Zendy

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Real-Time Diagnosis of Multiple Transistor Open-Circuit Faults in a T-Type Inverter Based on Finite-State Machine Model

Author(s) -

Borong Wang

Publication year - 2020

Publication title -

cpss transactions on power electronics and applications

Language(s) - English

Resource type - Journals

ISSN - 2475-742X

DOI - 10.24295/cpsstpea.2020.00007

Subject(s) - inverter , fault (geology) , finite state machine , state (computer science) , reliability (semiconductor) , computer science , control theory (sociology) , set (abstract data type) , stuck at fault , transistor , fault model , combinational logic , voltage , engineering , electronic engineering , logic gate , algorithm , electronic circuit , fault detection and isolation , artificial intelligence , electrical engineering , control (management) , power (physics) , physics , quantum mechanics , seismology , geology , actuator , programming language

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