Open AccessReliability and Survival Analyses of Mobile OS Via Weibull Model
Author(s) -
Ph.D et al. Julliard Ralihalizara
Publication year - 2020
Publication title -
international journal of information systems management research and development
Language(s) - English
Resource type - Journals
eISSN - 2319-4480
pISSN - 2250-236X
DOI - 10.24247/ijismrddec20202
Subject(s) - weibull distribution , reliability engineering , reliability (semiconductor) , computer science , environmental science , statistics , engineering , mathematics , physics , power (physics) , quantum mechanics
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