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Investigation on microstructural and spectroscopy properties of SnxO2W1-xO3 Thick Film Resistors
Publication year - 2022
Publication title -
journal of chemical, biological and physical sciences
Language(s) - English
Resource type - Journals
ISSN - 2249-1929
DOI - 10.24214/jcbps.c.12.1.00125
Subject(s) - materials science , resistor , spectroscopy , composite material , electrical engineering , engineering , physics , quantum mechanics , voltage

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