Open AccessDETECTION OF INFORMATIVE PARAMETER FOR DETERMINATION OF POTENTIALLY UNRELIABLE SEMICONDUCTOR DEVICE IN GROUP SEQUENCING CHAIN OF CONVERTER
Author(s) -
Н.Н. Беспалов,
S. S. Kapitonov,
Mikhail Ilyin,
Алексей Владимирович Евишев,
Александр Владимирович Зорькин
Publication year - 2017
Publication title -
naučno-tehničeskij vestnik povolžʹâ
Language(s) - English
Resource type - Journals
ISSN - 2079-5920
DOI - 10.24153/2079-5920-2017-7-2-43-46
Subject(s) - group (periodic table) , chain (unit) , semiconductor , computer science , computational biology , optoelectronics , biology , materials science , chemistry , physics , organic chemistry , astronomy