
QUALITY CONTROL AND RELIABILITY OF LEDS IN SCATTER THEMAL PARAMETERS
Author(s) -
Alexander Maltsev
Publication year - 2016
Publication title -
naučno-tehničeskij vestnik povolžʹâ
Language(s) - English
Resource type - Journals
ISSN - 2079-5920
DOI - 10.24153/2079-5920-2016-6-6-86-88
Subject(s) - reliability (semiconductor) , quality (philosophy) , light emitting diode , reliability engineering , control (management) , materials science , environmental science , computer science , optoelectronics , engineering , physics , artificial intelligence , thermodynamics , power (physics) , quantum mechanics