Open AccessFORECASTING RESIDUAL LIFE OF OPTOELECTRONIC DEVICES ACCORDING TO THE CRITERION LIMIT OF RESOLUTION
Author(s) -
A.J. Strjkov,
A. Fedotov,
Pavlo Ivanov
Publication year - 2016
Publication title -
naučno-tehničeskij vestnik povolžʹâ
Language(s) - English
Resource type - Journals
ISSN - 2079-5920
DOI - 10.24153/2079-5920-2016-6-3-72-74
Subject(s) - residual , limit (mathematics) , resolution (logic) , optoelectronics , high resolution , detection limit , materials science , optics , physics , computer science , reliability engineering , mathematics , statistics , algorithm , remote sensing , engineering , artificial intelligence , mathematical analysis , geology